Particle Fallout Analysis reports will provide the quantity & size distribution of the contamination gathered by optical quality silicon witness wafers exposed to the atmosphere within the environment of interest.  Results will be presented qualitatively (scans), graphically and quantitatively through calculation and reporting of IEST 1246D (formerly MIL-STD 1246C), “Surface Cleanliness Levels”.

Fallout Wafer Scan Sample - Cleanroom